Exchange bias and negative magnetoresistance in [Co/Bi/Co]/IrMn thin films] |
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Authors: | C. Christides Th. Speliotis |
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Affiliation: | a Department of Engineering Sciences, University of Patras, Rion, Patras 26504, Greece b Institute of Materials Science, NCSR Demokritos, 15310, Aghia Paraskevi, Athens, Greece |
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Abstract: | The artificial control of grain-boundary resistance and its contribution to magnetic and magneto-transport properties in [Co(3 nm)/Bi(2.5 nm)/Co(3 nm)]Ir20Mn80(12 nm) thin films that exhibit exchange bias is studied. Transverse magnetoresistance (MR) loops exhibit a negative MR in thin films grown by magnetron sputtering on Si/SiNx(100 nm) substrates. This negative MR effect is of the giant-MR (GMR) type, although its magnitude is less than 1%. A considerable exchange bias (EB) effect is observed only at lower temperatures, where both, GMR and isothermal magnetization loops exhibit a shift of −600 Oe at 5 K. |
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Keywords: | 75.70.&minus i 75.60.&minus d 74.78.Fk 73.50.Jt 73.50.&minus h |
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