Effects of interfacial roughness on the magnetoresistance of Co/Cu multilayers

Using a semi-classical approach, Hood, Falicov and Penn have studied the effects of interfacial roughness on the magnetoresistance (MR) of iron based trilayers (Fe/Cr/Fe and Fe/Cu/Fe). We extend their theory to magnetic metallic multilayers composed of N bilayers ferromagnetic-normal metal. The in plane MR of Co/Cu multilayers is calculated for correlated quasiperiodic interfaces. The averaged effects due to impurities, interdiffusion, band structure, etc. are included in a simple way using two phenomenological parameters S^↑ and S^↓ for two directions of spin. MR variation with S^↑, S^↓ and relaxation time is reported. We analyse also recent experimental data giving the influence of number of bilayers on the MR of Co/Cu multilayers for different temperatures.