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Depth resolution of a laser profilometer based on photo-EMF detector |
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| Authors: | M.L. Arroyo Carrasco P. Rodriguez Montero M. Sanchez Sanchez S. Stepanov |
| Affiliation: | aInstituto Nacional de Astrofísica, Óptica y Electrónica – INAOE, Ap. Post. 51 y 216, 72000, Puebla, México |
| Abstract: | |
| Keywords: | Coherence photo-EMF effect topometry |
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