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A digital calibration technique for an ultra high-speed wide-bandwidth folding and interpolating analog-to-digital converter in 0.18-μm CMOS technology
引用本文:余金山,张瑞涛,张正平,王永禄,朱璨,张磊,俞宙,韩勇.A digital calibration technique for an ultra high-speed wide-bandwidth folding and interpolating analog-to-digital converter in 0.18-μm CMOS technology[J].半导体学报,2011,32(1):108-115.
作者姓名:余金山  张瑞涛  张正平  王永禄  朱璨  张磊  俞宙  韩勇
作者单位:National Laboratory of Analog IC's;12th Institute of CETC;School of Computer University of Defense Technology;
基金项目:Project supported by the National Natural Science Foundation of China(Nos.60906009,60773025); the Postdoctoral Science Foundation of China(No.20090451423); the National Labs of Analog Integrated Circuits Foundation(No.9140C0901110902)
摘    要:A digital calibration technique for an ultra high-speed folding and interpolating analog-to-digital converter in 0.18-μm CMOS technology is presented.The similar digital calibration techniques are taken for high 3-bit flash converter and low 5-bit folding and interpolating converter,which are based on well-designed calibration reference, calibration DAC and comparators.The spice simulation and the measured results show the ADC produces 5.9 ENOB with calibration disabled and 7.2 ENOB with calibration enabled for high-frequency wide-bandwidth analog input.

关 键 词:ultra  high-speed  wide-bandwidth  folding  interpolating  analog-to-digital  converter
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