A Cauchois-type X-ray spectrometer for momentum density studies on heavy-element materials |
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Authors: | Y. Sakurai M. Itou |
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Affiliation: | Japan Synchrotron Radiation Research Institute (JASRI), Experimental Research Division, SPring-8, 1-1-1 Kouto, Sayo, Mikazuki, Hyogo 679-5198, Japan |
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Abstract: | This article describes the new spectrometer setup for high-resolution Compton scattering experiments at BL08W, SPring-8. It employs an X-ray image intensifier (X-II) system as a position sensitive detector (PSD). The installation of the X-II system has improved the data-acquisition efficiency by 20 times compared to the previous quasi-PSD system. Compton profiles of CeRh3B2 have been measured with sufficient statistical accuracy, which indicates that the new setup can measure Compton profiles of virtually all materials within a reasonable beamtime. |
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Keywords: | 07.85.Nc 78.70Ck 29.40Gx |
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