X射线荧光光谱法在电气石标准物质均匀性检验中的应用

采用粉末压片–X射线荧光光谱法对电气石标准物质候选物的均匀性进行检验。选择Si,Al,Mg,Fe,Ca,Na等6个元素作为检验元素,样品以随机方式进行测量,根据单因素方差分析的F值和测定值的相对标准偏差(RSD)判定样品的均匀性,并计算了检测方法的误差和样品不均匀误差。结果表明,方差检验的F计算值在0.80~1.93之间,小于F临界值1.96,测定结果的相对标准偏差小于0.9%;检测方法相对标准偏差和样品不均匀度(以RSD表示)均小于0.5%,说明制备的电气石标准物质候选物具有良好的均匀性。通过公式计算,确定最小取样量为200 mg。该方法无需湿法分解样品,绿色环保,简便快速,测定结果精密度高。

Application of X-Ray Fluorescence Spectrometry in the Homogeneity Test of Tourmaline Reference Materials

The homogeneity test of tourmaline candidate reference materials was performed by X-ray fluorescence spectrometry. The elements such as Si,Al,Mg,Fe,Ca and Na were selected for homogeneity testing. The samples were measured in a random manner. The homogeneity was evaluated by F value of variance analysis and RSD of detection results. The F value in analysis of variance was in the range of 0.80-1.93,which was less than the F critical value 1.96. The relative standard diviation (RSD) of the results was less than 0.9%. The RSD of detection method and sample inhomogeneity (RSD) were less than 0.5%. It was indicated that the tourmaline candidate reference materials had good homogeneity. The minimum sampling amount was given as 200 mg by calculation. This method avoids wet decomposition of the sample and has the advantages of environment-friendly,it is simple,rapid and has high precision.