Composition and Structure of Anodic Oxide Films on Titanium–Aluminum Alloys by Fast Electron Reflection Diffraction, Rutherford Backscattering, and Secondary Neutral Particle Mass Spectrometry |
| |
Authors: | A. N. Kamkin L. A. Fishgoit A. D. Davydov |
| |
Affiliation: | (1) Moscow State University, Vorob'evy gory 1, Moscow, 119899, Russia;(2) Frumkin Institute of Electrochemistry, Russian Academy of Sciences, Leninskii pr. 31, Moscow, 119071, Russia |
| |
Abstract: | Anodic oxide films on some Ti–Al alloys are studied using fast-electron reflection diffraction, Rutherford backscattering, and secondary neutral-particle mass spectrometry. The films are amorphous, with a small amount of crystalline phases, and comprise a mixture of TiO2 and Al2O3. The Ti/Al ratio in an anodic film corresponds to that in the alloy matrix. Constants of anodic oxidation of the alloys are determined. |
| |
Keywords: | |
本文献已被 SpringerLink 等数据库收录! |
|