K-line X-ray fluorescence analysis of high-Z elements |
| |
| Institution: | 1. ENEA Centro Ricerche, Dipartimento FNS, Frascati, Italy;2. Physics Department of the University and INFN, Pisa, Italy;3. Centre d''Etudes Lasers Intenses et Applications (CELIA) - Université de Bordeaux, CNRS, CEA, 351 cours de la liberation, 33405 Talence, France;4. Cyclotron Institute, Texas A&M University, College Station, TX 77843, USA;5. Institute of Plasma Physics and Laser Microfusion, Warsaw, Poland;6. Dip. Ingegneria Industriale, Università di Roma “Tor Vergata”, Via del Politecnico 1, I-00133 Roma, Italy;1. Department of Studies in Physics, Karnatak University, Dharwad, 580003, India;2. X-ray Optics Section, Indus Synchrotron Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore, 452013, India;1. Department of Physics, Karnatak University, Dharwad 580 003, India;2. Department of Physics, BVB College of Engineering & Technology, Hubli 580 031, India;3. X-ray Optics Section, Indus Synchrotron Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore 452 013, India |
| |
| Abstract: | X-ray fluorescence analysis with high-energy photons (typically 40–100 keV) is described. Measurement of K-lines from high-Z elements has attractive advantages, which are not available by L-line analysis in normal X-ray region. Through the comparison of excitation methods, it has been found that quasi-monochromatic beams with sufficient intensity and moderate spectral distribution are most suitable for improving the detection limit. Performances of other excitation methods and recent experimental trends are also discussed. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
