首页 | 本学科首页   官方微博 | 高级检索  
     


An analysis of Y2O3:Eu thin films for thermographic phosphor applications
Authors:Eric J. Bosze  Gustavo A. Hirata
Affiliation:a Department of Mechanical and Aerospace Engineering and Materials Science and Engineering Program, UC San Diego, La Jolla, CA 92093-0411, USA
b Centro de Nanociencias y Nanotecnología, Universidad Nacional Autónoma de México, Ensenada, Baja California, MX CP 22860, Mexico
Abstract:A comparative study of the luminescent properties of Y2O3:Eu3+ phosphor powders and thin films sputtered from targets prepared from combustion synthesized powders is reported. Thin films of (Y0.96Eu0.04)2O3 were deposited on silicon substrates. Films deposited at 600 °C had both monoclinic and cubic phases of Y2O3, which developed to an oriented cubic phase after annealing. Films and powders showed a linear dependence of the intensity of the 5D77F2 (611 nm) transition with temperature in the range 26-660 °C with an average rate of change of 1.8×10−4 °C−1. The rate of change appears to be dependent on the Eu3+ concentration. This work shows that these thin films can be used as thermographic phosphors for remote temperature measurements.
Keywords:Thermographic phosphor   Yttrium oxide   Thin film   Europium   Luminescence properties
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号