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Effects of Unintended Dopants on I-V Characteristics of the Double-Gate MOSFETs,a Simulation Study
Authors:LI Pei-Cheng  MEI Guang-Hui  HU Guang-Xi  WANG Ling-Li  LIU Ran  TANG Ting-Ao
Affiliation:State Key Laboratory of ASIC and System, School of Information Science and Technology, Fudan University, Shanghai 200433, China
Abstract:In this paper, we study the effects of an unintended dopant in the channel on the current-voltage characteristics of a Double-Gate (DG) Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET). Non-Equilibrium Green's Function (NEGF) approach is used. A quantum transport model to calculate the drain current is presented and subthreshold swing and drain induced barrier lowering (DIBL) effect are studied.
Keywords:current-voltage characteristics  double gate  MOSFET  unintended dopant  
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