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Neutral impurity scattering in semiconductors
Authors:B. Alkan
Affiliation:(1) Department of Engineering Physics, Faculty of Sciences, University of Ankara, 06100 Tandogan, Ankara, Turkey
Abstract:Summary Applying the correlation function technique, a temperature-independent mobility μn has been obtained and it is shown that this μn remains close to the experimental mobility ofn-type Ge around 10 K.
Keywords:Scattering by point defects   dislocation   surfaces   and other imperfections (including Kondo effect)
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