Morphological and elemental characterisation with the high-energy ion-nanoprobe LIPSION |
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Authors: | T. Butz Ch. Meinecke M. Morawski T. Reinert M. Schwertner D. Spemann J. Vogt |
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Affiliation: | Nukleare Festkörperphysik, Fakultät für Physik und Geowissenschaften, Universität Leipzig, Linnéstr.5, 04103 Leipzig, Germany |
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Abstract: | This contribution deals with the morphological and elemental characterisation with high-energy (MeV) focused ion beams (in particular protons) with special emphasis on high spatial resolution in the sub-micrometer regime and very low minimum detection limits (sub-ppm) in trace element analysis. The most important methods like particle induced X-ray emission (PIXE), Rutherford backscattering spectrometry (RBS), as well as scanning transmission ion microscopy (STIM) and STIM-tomography will be illustrated by examples from material and life sciences. |
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Keywords: | 07.81.+a 78.70.En 82.80.Yc 68.55.&minus a |
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