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Characterization of microroughness parameters in gadolinium oxide thin films: A study based on extended power spectral density analyses |
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| Authors: | M Senthilkumar S Thakur RB Tokas |
| Institution: | Spectroscopy Division, Bhabha Atomic Research Centre, Modular Laboratories, Trombay, Mumbai 400 085, India |
| Abstract: | |
| Keywords: | 42 79W 68 35 C 61 16C 81 15E |
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