Free-electron laser for infrared SEW characterization surfaces of conducting and dielectric solids and nm films on them |
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| Authors: | GN Zhizhin EV Alieva LA Kuzik VA Yakovlev DM Shkrabo AFG van der Meer MJ van der Wiel |
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| Institution: | (1) Institute of Spectroscopy, Russian Academy of Sciences, Troitsk, Moscow region, 142092 Russia (Fax: +07-095/334-08-86, E-mail: zhizhin@isan.troitsk.ru), RU;(2) FOM-Institute for Plasma Physics Rijnhuizen, P.O. Box 1207, 3430 BE Nieuwegein, The Netherlands (Fax: +31-030/60-31204, E-mail: meer@rijnh.nl), NL;(3) Eindhoven Univ. of Technology, Dept. of Appl. Phys., P.O. Box 513, 5600 MB Eindhoven, The Netherlands (Fax: +31-040/243-8060, Internet: http//www.cycl.phys.tue.nl), NL |
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| Abstract: | 2 , BaF2, MgO, LiNbO3 were determined. The nonlinear spectroscopy applications of SEW–FEL techniques to studies of a second-harmonic generation
(SHG) on crystal surfaces in the regime of counterpropagating SEWs – the frequency dependence of efficiency and the influence
of a thin film deposition on a quartz surface – are described.
Received: 15 May 1998/Accepted: 25 August 1998 |
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| Keywords: | PACS: 07 65 Gj 42 65 Ky 78 66 -w |
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