| 基于Zernike正交矩的亚像素图像线宽测量算法 |
| |
| 引用本文： | 秦垚,王伯雄,罗秀芝.基于Zernike正交矩的亚像素图像线宽测量算法[J].光学技术,2012(6):729-733. |
| |
| 作者姓名： | 秦垚 王伯雄 罗秀芝 |
| |
| 作者单位： | 清华大学精密仪器与机械学系精密测试技术及仪器国家重点实验室 |
| |
| 基金项目： | 国家“863”高技术计划(2008AA042207) |
| |
| 摘 要： | 针对图像内的细窄线宽,提出了一种基于Zernike正交矩的亚像素图像线宽检测算法。该算法具有明确的几何模型,通过计算图像的2阶和4阶Zernike正交矩,推导出了亚像素线宽表达式。根据数字图像的离散性,给出了计算正交矩所需的模板系数,并分析了由离散性造成的原理误差。将所提出的亚像素线宽检测技术应用于安瓿内异物粒径的标定实验,结果表明:该算法可有效地测量弱小目标在图像中的亚像素线宽值,从而得到了异物粒径大小与亚像素线宽之间的标定曲线。
|
| 关 键 词： | 线宽检测 Zernike正交矩 微粒标定 |
Measurement algorithm for sub-pixel line width in images based on Zernike moment |
| |
| Qin Yao,Wang Boxiong,Luo Xiuzhi.Measurement algorithm for sub-pixel line width in images based on Zernike moment[J].Optical Technique,2012(6):729-733. |
| |
| Authors: | Qin Yao Wang Boxiong Luo Xiuzhi |
| |
| Institution: | (State Key Laboratory of Precision Measurement Technology and Instruments,Department of Precision Instruments and Mechanology,Tsinghua University,Beijing 100084,China) |
| |
| Abstract: | A measurement algorithm based on Zernike moment for measuring thin line in images is presented.The algorithm has a definite geometric model.The expression of sub-pixel line width is derived by calculating second-order and fourth-order orthogonal Zernike moments of an image.According to the discreteness of digital images,a template coefficient is presented for calculating orthogonal moments and the principle error caused by the discreteness is analyzed.The proposed sub-pixel line width detection algorithm has been used in the calibration experiment for particle diameters in ampoule.The result shows that the sub-pixel line width of small particles in images can be efficiently measured by using this algorithm and the curve of sub-pixel line width vs particle diameter is obtained. |
| |
| Keywords: | line width detection Zernike moment small particles calibration |
| 本文献已被 CNKI 等数据库收录！ |
