LED可靠性评估的加速寿命试验设计方法

介绍了一种关于发光二极管（LED）可靠性评估的加速寿命试验设计方法。通过这个方法,在针对LED的性能退化现象和运行不稳定问题进行加速试验设计时,可以在已知目标可靠度和置信度的前提下,定量地确定满足可靠性要求的试验用样本量、加速应力水平以及试验时间。同时,用于发光二极管加速寿命试验的基本设计思想,可以广泛地应用于常见电子元器件的器件产品质量认证或可靠性评估等试验设计中。

Accelerated Life Test Design for the Reliability Assessment of LEDs

This paper presents an accelerated life test design methodology for th assessment of light emitting diodes （LEDs） . Using this methodology, the degradati e reliability on behavior and the performance uncertainties of LEDs are considered in the design to determine the sample size, accelerated stress conditions, and test duration for a given value of targeted reliability and confidence level. Although discussions in this paper are mostly limited to light emitting diodes, the basic idea of the methodology can be applied to the accelerated test design of electronic components in general for component qualification and/or reliability assessment.