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Stable crack growth in aluminum tensile specimens
Authors:B S -J Kang  A S Kobayashi  D Post
Institution:(1) Department of Mechanical Engineering, FU-10, University of Washington, 98195 Seattle, WA;(2) Department of Engineering Science and Mechanics, Virginia Polytechnic Institute and State University, 24601 Blacksburg, VA
Abstract:Post's white-light moiré interferometry was used to obtain sequential records of the transientU y -displacement fields associated with stable crack growth in 7075-T6 and 2024-0, single-edge-notched (SEN) specimens with fatigued cracks. TheU y -displacement fields are used to evaluate the crack-tip opening displacement (CTOD), far- and near-fieldJ-integral values, Dugdale-strip-yield model, William's polynomial function and the HRR field. Paper was presented at 1985 SEM Spring Converence on Experimental Mechanics held in Las Vegas, NV on June 9–14.
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