| 二维热传导型半导体器件的特征有限体积元方法和H1模分析 |
| |
| 引用本文： | 龙晓瀚,陈传军. 二维热传导型半导体器件的特征有限体积元方法和H1模分析[J]. 系统科学与数学, 2009, 29(5): 706-720 |
| |
| 作者姓名： | 龙晓瀚 陈传军 |
| |
| 作者单位： | 1. 鲁东大学数学与信息学院,烟台,264025
2. 烟台大学数学与信息科学学院,烟台,264005 |
| |
| 基金项目： | 鲁东大学创新团队建设项目 |
| |
| 摘 要： | 将特征线方法与有限体积元方法相结合,采用分片线性函数和分片常数函数分别作为有限体积元方法的试探函数和检验函数空间,构造了热传导型半导体器件的全离散特征有限体积元格式.并进行收敛性分析,在一般的条件下得到了最优阶H1模误差估计结果.
|
| 关 键 词： | 半导体 特征线 有限体积元方法 误差估计. |
| 收稿时间： | 2005-06-10 |
| 修稿时间： | 2008-12-19 |
$H^1$ Error Estimates for the Finite Volume Element Method Along Characteristics for Two Dimensional Semiconductor Device with Heat Conduction |
| |
| LONG Xiaohan,CHEN Chuanjun. $H^1$ Error Estimates for the Finite Volume Element Method Along Characteristics for Two Dimensional Semiconductor Device with Heat Conduction[J]. Journal of Systems Science and Mathematical Sciences, 2009, 29(5): 706-720 |
| |
| Authors: | LONG Xiaohan CHEN Chuanjun |
| |
| Affiliation: | School of Mathematics and Information, Ludong University, Yantai 264025 |
| |
| Abstract: | Combined with the method of characteristics, a fully discrete finite volume element method for two dimensional semiconductor device is derived and studied, with piecewise linear function as trial function and piecewise constant as test function. Through convergence analysis an optimal H1 error estimate is obtained under general condition. |
| |
| Keywords: | Semiconductor characteristics finite volume element method error estimates. |
| 本文献已被 万方数据 等数据库收录！ |
| 点击此处可从《系统科学与数学》浏览原始摘要信息 |
|
点击此处可从《系统科学与数学》下载全文 |
