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Effect of tip size on force measurement in atomic force microscopy
Authors:Lim Leonard T W  Wee Andrew T S  O'Shea Sean J
Institution:Department of Physics, National University of Singapore, Lower Kent Ridge Road, Singapore 119620.
Abstract:An atomic force microscope (AFM) has been used to study solvation forces at the solid-liquid interface between highly oriented pyrolytic graphite (HOPG) and the liquids octamethylcyclotetrasiloxane (OMCTS), n-hexadecane (n-C16H34), and n-dodecanol (n-C11H23CH2OH). Oscillatory solvation forces (F) are observed for various measured tip radii (Rtip=15-100 nm). It is found that the normalized force data, F/Rtip, differ between AFM tips with a clear trend of decreasing F/Rtip with increasing Rtip.
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