On a Modification of the Scintillation Method

We solve the problem of diffraction of fluctuating radiation by an optically thin irregular layer (phase screen) with developed turbulent structure. It is shown that in the case of diffraction of radiation with saturated fluctuations and a narrow-band frequency spectrum by a weakly turbulent moving phase screen, the measured frequency spectrum of intensity fluctuations in the observation plane allows one to obtain information on the form of the spectrum of irregularities of an optically thin irregular layer in a wide size range significantly exceeding the size of the first Fresnel zone. Similarly to the well-known phase method of diagnostics of randomly irregular media, the conventional scintillation method modified in such a way yields undistorted information on the form of the irregularity spectrum. However, in contrast to the phase method, it also allows one to obtain data on the drift velocity of irregularities in the studied irregular layer.