Image of a straight edge in confocal self-interference microscopy |
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| Authors: | Kang DongKyun Gweon DaeGab |
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| Affiliation: | Nano Opto Mechatronics Laboratory, Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, Gusung-dong, Yusung-gu, Daejeon, South Korea. godogo@kaist.ac.kr |
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| Abstract: | An image of a straight edge in confocal self-interference microscopy (CSIM) is analyzed. Simulations of edge images based on a two-dimensional imaging equation are presented that show a 103% increase in edge gradient and a 43.1% decrease in the 10-90% width. The first experimental results, to our knowledge, for CSIM are presented and show good agreement with the simulation results and a 23% decrease in the 10-90% width. |
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