Validity of the semi-classical approach for calculation of the surface excitation parameter |
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Authors: | Da B Mao S F Ding Z J |
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Affiliation: | Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China. |
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Abstract: | The problem of surface plasmon excitation by moving charges has been elaborated by several different approaches, mainly based on dielectric response theory within either semi-classical or quantum mechanical frameworks. In this work, a comparison of the surface excitation effect between two different frameworks is made by calculation of the differential inverse inelastic mean free path (DIIMFP) and a Monte Carlo simulation of reflection electron energy loss spectroscopy (REELS) spectra. A semi-classical modeling of the interaction between electrons and a solid surface is based on analyzing the work done by moving electrons; the stopping power and inelastic cross section are derived with the induced potential. On the other hand, a quantum mechanical approach is based on derivation of the complex inhomogeneous self-energy of the electrons. The numerical calculation shows that the semi-classical model presents almost the same values of DIIMFP as by the quantum model except at the glancing condition. The simulation of REELS spectra for Ag and SiO(2) as well as a comparison with experimental spectra also confirms that a good agreement with the spectral shape is found among the two simulation results and the experimental data. |
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