首页 | 本学科首页   官方微博 | 高级检索  
     检索      

设备级线缆强电磁辐照敏感度仿真分析
引用本文:刘恩博,李智深,陈 旗,张 钰.设备级线缆强电磁辐照敏感度仿真分析[J].太赫兹科学与电子信息学报,2019,17(6):1045-1050.
作者姓名:刘恩博  李智深  陈 旗  张 钰
作者单位:EMC Institute,GRG Metrology and Test,Guangzhou Guangdong 510656,China,Zhenjiang Military Representative Room,Military Representative Bureau of Equipment Development Department,Zhenjiang Jiangsu 212000,China,EMC Institute,GRG Metrology and Test,Guangzhou Guangdong 510656,China and EMC Institute,GRG Metrology and Test,Guangzhou Guangdong 510656,China
摘    要:针对近年来复杂电磁环境中强电磁脉冲攻击,研究得出设备级强电磁辐照敏感度仿真分析方法。该方法采用3D电磁场仿真及2D电路仿真相结合的手段,通过建立几何模型、定义材料参数、添加负载及激励源、放置监测探头等步骤,最终仿真得出设备外壳内部及线缆上耦合电流的时域、频域特性。由仿真结果可知,设备内部及线缆上耦合的电压、电流在极短时间内即可达到具有破坏性的峰值,且其同时具备较宽的频谱,从而可对多种电子设备造成毁伤。因此,当电子设备处在复杂电磁环境强电磁脉冲攻击下,必须采取一定的强电磁保护措施。本仿真方法也可适用其他通用电子设备强电磁辐照敏感度仿真分析。

关 键 词:复杂电磁环境  强电磁脉冲  电磁场仿真  辐照敏感度  线缆
收稿时间:2018/1/10 0:00:00
修稿时间:2018/7/31 0:00:00

Simulation analysis of cable harsh electromagnetic irradiation susceptibility about electronics
LIU Enbo,LI Zhishen,CHEN Qi and ZHANG Yu.Simulation analysis of cable harsh electromagnetic irradiation susceptibility about electronics[J].Journal of Terahertz Science and Electronic Information Technology,2019,17(6):1045-1050.
Authors:LIU Enbo  LI Zhishen  CHEN Qi and ZHANG Yu
Abstract:A simulation analysis method of harsh electromagnetic irradiation susceptibility about electronics is proposed aiming for high electromagnetic pulse attack in complex electromagnetic environment. This method combines 3D electromagnetic field simulation with 2D electric circuit simulation, which includes steps of building model, defining material parameters, adding load and exciting source, placing observation points. This method can obtain time-domain and frequency-domain characteristic of space and cable. According to the simulation results, the voltage and current in space and cable can reach peak soon with broad frequency domain, which are able to destroy many electronics. Therefore, some methods should be adopted to protect electronic devices. The proposed simulation method also can be utilized to analyze harsh electromagnetic irradiation susceptibility of all common electronics.
Keywords:
点击此处可从《太赫兹科学与电子信息学报》浏览原始摘要信息
点击此处可从《太赫兹科学与电子信息学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号