Proton-induced x-ray emission analysis of tea leaves

Proton-induced X-ray emission (PIXE) spectroscopy has been used for the determination of the concentration of 12 elements in tea leaves of four different brands. The elements are: Cl, K, Ca, Ti, Mn, Fe, Ni, Cu, Zn, Br, Rb and Sr. The transference ratio of the elements into solution, when tea is leached by percolation is reported. It was found that some elements are totally transferred into solution and some are partially retained by the leaves. The significance of some of the elements found in the samples is discussed.