首页 | 本学科首页   官方微博 | 高级检索  
     检索      

有孔双层屏蔽腔体的宽频带屏蔽效能
引用本文:宋航,饶育萍,张超,周东方,侯德亭.有孔双层屏蔽腔体的宽频带屏蔽效能[J].强激光与粒子束,2008,20(10).
作者姓名:宋航  饶育萍  张超  周东方  侯德亭
作者单位:1. 解放军信息工程大学 信息工程学院, 郑州 450002;2. 武警河南省总队 武警郑州市支队, 郑州 450000
基金项目:国家高技术发展计划项目
摘    要: 用扩展为可分析腔内高次模的传输线方法研究了有孔双层屏蔽腔体的屏蔽效能,该方法可以考虑腔内较宽的频带范围。计算了双层屏蔽腔内电场的屏蔽系数,与单层屏蔽腔内屏蔽系数的比较表明,采用双层屏蔽使得腔体的屏蔽效能大为提高。分析了双层屏蔽腔体孔缝耦合的共振效应、腔内的谐振。结果表明:满足共振效应成立条件时双层屏蔽腔内也发生共振现象,屏蔽效能在共振频率附近明显降低;在腔内的谐振点屏蔽系数出现极小值,此时屏蔽效果较差;在0.1~4.5 GHz的范围内,屏蔽系数随着频率的增加总体上呈下降趋势。

关 键 词:传输线法  双层屏蔽  屏蔽效能  孔缝  耦合
收稿时间:1900-01-01;

Shielding effectiveness of double layer rectangular enclosure with aperture to wide band electromagnetic pulse
SONG Hang,RAO Yu-ping,ZHANG Chao,ZHOU Dong-fang,HOU De-ting.Shielding effectiveness of double layer rectangular enclosure with aperture to wide band electromagnetic pulse[J].High Power Laser and Particle Beams,2008,20(10).
Authors:SONG Hang  RAO Yu-ping  ZHANG Chao  ZHOU Dong-fang  HOU De-ting
Institution:1. PLA Information Engineering University, P.O.Box 1001-826, Zhengzhou 450002, China;2. Armed Police Force of Henan, APF Zhengzhou Unit, Zhengzhou 450000, China
Abstract:The transmission line method(TLM) is extended to include higher-order transverse electric(TE) cavity modes which are introduced by aperture coupling and the extended TLM is used to analyze the shielding effectiveness(SE) of double layer rectangular enclosure with apertures to the wide band electromagnetic pulse. The electric SE of single layer with an aperture is compared with that of double layer with apertures. The simulation results show that SE can be improved greatly with double layer shielding and it is worse on the resonance frequency of cavity modes. On the condition of aperture-cavity resonance, SE drops significantly in the center of the inner cavity. From 0.1 GHz to 4.5 GHz, SE has a declining trend as a whole.
Keywords:Double-layer shielding  Shielding effectiveness  Aperture  Couple
本文献已被 维普 万方数据 等数据库收录!
点击此处可从《强激光与粒子束》浏览原始摘要信息
点击此处可从《强激光与粒子束》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号