首页 | 本学科首页   官方微博 | 高级检索  
     


Full-field measurement of surface reflectivity using a microscopy for refractive index profiling of GRIN lenses
Authors:Chun-Jen?Weng  author-information"  >  author-information__contact u-icon-before"  >  mailto:cjweng@itrc.narl.org.tw"   title="  cjweng@itrc.narl.org.tw"   itemprop="  email"   data-track="  click"   data-track-action="  Email author"   data-track-label="  "  >Email author,Chih-Yen?Chen,Chi-Hung?Hwang,Da-Ren?Liu
Affiliation:1.National Applied Research Laboratories,Instrument Technology Research Center,Hsinchu city,Taiwan
Abstract:This paper outlines an improved technique for profiling the refractive index of Graded-index (GRIN) lenses based on the measurements obtained from a reflectivity image. Reflective cross-sectional image of the GRIN lens were compared with a reflectance reference target under illumination at small incidence angles to obtain the full-field refractive index distribution of the GRIN lens quickly and easily.
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号