首页 | 本学科首页   官方微博 | 高级检索  
     检索      


On-line phase measuring profilometry based on phase matching
Authors:Xingfen?Xu  Email author" target="_blank">Yiping?CaoEmail author  Cheng?Chen  Yingying?Wan
Institution:1.Department of Opto-Electronics Science and Technology,Sichuan University,Chengdu,China
Abstract:On-line phase measuring profilometry based on phase matching is proposed. While just one fixed sinusoidal fringe is projected on a measured object moving with the pipeline, deformed patterns modulated by the object moving at the same distance moment are captured synchronously by the CCD camera. The phase information of the object in those captured deformed patterns can be predicted using FTP method to assist the pixel matching so as to realize the point-to-point correspondence of the object in the captured deformed patterns. Meanwhile, the equivalent phase-shifting deformed patterns can be extracted. So the three dimensional shape of the object can be reconstructed successfully with an equal phase-shifting algorithm. Numerical simulation and experiments show feasibility and validity of the proposed method.
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号