Theory for the effect of the tip–surface interaction potential on atomic resolution in forced vibration system of noncontact AFM

We present a perturbation theory which enables us to understand the physics of the cantilever-forced vibration in noncontact atomic-force microscopy (nc-AFM). Analytical expressions of the resonance curve and frequency shift are given. This theory is applied to the model system with a van der Waals tip–surface interaction potential. Based on this case study, it is elucidated how the resonance frequency shift is analytically described by an integral of the tip–surface interaction force. Then nc-AFM image of Si(111) 7×7 surface is calculated by the present theory. It is examined that this theory works as an algorithm for nc-AFM image simulator.