Determination of trace impurities in tantalum powder and its compounds by inductively coupled plasma optical emission spectrometry using solvent extraction |
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| Authors: | G Anil M R P Reddy T L Prakash |
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| Institution: | (1) Characterization Division, Center for Materials for Electronics Technolog (C-MET) IDA, Phase II, HCL Post, Cherlapally, Hyderabad, 500051, India |
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| Abstract: | A procedure was developed for the analysis of 18 trace impurity elements in capacitor-grade tantalum powder (Ta), potassium
tantalum fluoride (K2TaF7), and tantalum pentoxide (Ta2O5) using inductively coupled plasma optical emission spectrometry (ICP-OES). The detection limits achieved were in the ppb
levels. The samples were dissolved in hydrofluoric acid (HF) in a microwave digestion system and the Ta matrix was extracted
using cyclo hexanone. The impurity traces remained almost completely in the aqueous phase.
The text was submitted by the authors in English. |
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