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AFM of adsorbed polyelectrolytes on cellulose I surfaces spin-coated on silicon wafers
Authors:Julie?Lefebvre  Email author" target="_blank">Derek?G?GrayEmail author
Institution:(1) Department of Chemistry, Pulp and Paper Research Centre, McGill University, 3420 University Street, H3A 2A7 Montreal, QC, Canada
Abstract:Thin layers of cellulose I nanocrystals were spin-coated onto silicon wafers to give a flat model cellulose surface. A mild heat treatment was required to stabilize the cellulose layer. Interactions of this surface with polyelectrolyte layers and multilayers were probed by atomic force microscopy in water and dilute salt solutions. Deflection–distance curves for standard silicon nitride tips were measured for silicon, cellulose-coated silicon, and for polyelectrolytes adsorbed on the cellulose surface. Transfer of polymer to the tip was checked by running deflection–distance curves against clean silicon. Deflection–distance curves were relatively insensitive to adsorbed polyelectrolyte, but salt addition caused transfer of cationic polyelectrolyte to the tip, and swelling of the polyelectrolyte multilayers.
Keywords:Atomic force microscopy  Carboxymethylcellulose  Cellulose  Nanocrystals  Poly(diallyl-dimethyl-ammonium chloride)  Silicon  Surface properties
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