Si/SiO2 multilayers: synthesis by reactive magnetron sputtering and photoluminescence emission |
| |
Authors: | C. Ternon F. Gourbilleau R. Rizk C. Dufour |
| |
Affiliation: | LERMAT, CNRS 2149, ISMRA, 6 Bd Maréchal Juin, F-14050, Caen Cedex, France |
| |
Abstract: | This paper relates a complete study of Si/SiO2 multilayer (ML) structures. First, we suggest an original way of synthesis based on reactive magnetron sputtering of a pure silica target. The photoluminescence spectra of these MLs consist of two Gaussian bands in the visible-near infrared spectral region. The stronger one (I band) is fixed at about 780 nm and probably due to interface states. The weaker one (Q band) is tuneable with the Si sublayer thickness and originates from a radiative recombination within the nanosized Si layers. For this latter band the peak position is a function of the Si sublayer thickness and shows a discontinuity at 30 Å. This corresponds to an Si phase change. For thicknesses above 30 Å, the sublayers are composed of nanocrystalline silicon whereas below 30 Å the sublayers are made of amorphous silicon. We develop a model based on a quantum well to which we have added an interfacial region between Si and SiO2. It is characterised by an interfacial potential of 0.3 eV. This model depicts the simultaneous behaviour of Q and I bands for an Si sublayer thickness below 30 Å. |
| |
Keywords: | Si/SiO2 multilayers Reactive sputtering Photoluminescence Microstructure |
本文献已被 ScienceDirect 等数据库收录! |