CdTe epilayers for uses in optical waveguides |
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| Authors: | J Rams NV Sochinskii V Munõz JM Cabrera |
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| Institution: | (1) Universidad Rey Juan Carlos, ESCET, Móstoles, 28933 Madrid, Spain, ES;(2) Dpto. Física Aplicada and ICMUV, Universitat de Valencia, c/Dr. Moliner, 50, 46100 Burjassot (Valencia), Spain, ES;(3) Dpto. Física de Materiales C-IV, Universidad Autónoma de Madrid, Cantoblanco, 28049, Madrid, Spain, ES |
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| Abstract: | CdTe epilayers have been grown by vapor phase epitaxy (VPE) on glass, MgO, sapphire, LiNbO3 and mica substrates. Scanning electron microscopy (SEM) and X-ray diffraction (XRD) studies show the good structural quality
of the epilayers. In these epilayers, a few optical modes were excited with a 1.33-μm laser. The measured propagation losses
were in the range between 5 dB/cm and less than 0.5 dB/cm. From dark-mode m-lines, the epilayer thickness was found to be
in the 1–3 μm range, in good accord with that obtained by SEM measurements. The refractive index obtained from the fitting
is also in good accord with that of bulk CdTe.
Received: 7 October 1999 / Accepted: 13 March 2000 / Published online: 5 July 2000 |
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| Keywords: | PACS: 78 66 Hf 42 82 Et |
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