Pulsed laser deposition of a PBN:65 morphotropic phase boundary thin film with large electrostriction |
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| Authors: | Xi Yang Andrew Beckwith Mikhail Strikovski |
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| Affiliation: | (1) Fermi National Accelerator Laboratory, P.O. Box 500, 60510-0500 Batavia, Illinois, USA;(2) Department of Physics, University of Houston, 77204-5005 Huston, Texas, USA |
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| Abstract: | We deposited epitaxial thin films of Morphotropic Phase Boundary (MPB) Pb0.65Ba0.35Nb2O6 (PBN:65) on MgO substrates using pulsed laser deposition. Afterwards, a novel transmission optical experiment was developed to measure the electric field-induced bending angle of the thin film sample using a divergent incident light. From which the electric field-induced strain was obtained, and it was used to calculate the electrostrictive constant of the PBN thin film. The result is 0.000875 μm2/V2, and it is consistent with what we measured in the reflection experiment |
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| Keywords: | Epitaxial thin films field-induced strain electrostrictive constant |
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