| 中红外光谱透射比标准物质研制 |
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| 引用本文： | 冯国进,马宇轩,梁凤臣,甘海勇,郑春弟,吴厚平,张巧香,刘子龙.中红外光谱透射比标准物质研制[J].化学分析计量,2020,29(1):1-3. |
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| 作者姓名： | 冯国进 马宇轩 梁凤臣 甘海勇 郑春弟 吴厚平 张巧香 刘子龙 |
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| 作者单位： | 中国计量科学研究院,北京100013;中国计量科学研究院,北京100013;中国计量科学研究院,北京100013;中国计量科学研究院,北京100013;中国计量科学研究院,北京100013;中国计量科学研究院,北京100013;中国计量科学研究院,北京100013;中国计量科学研究院,北京100013 |
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| 摘 要： | 采用物化性质稳定的单晶硅作为基质,以直流磁控溅射方式轻蒸镀不同厚度的镍、铬混合膜层,实现了中红外波段(500~4000 cm^–1)不同透射比标准物质的研制。研制的中红外光谱透射比标准物质其透射比标称值分别为10%和50%,扩展不确定度优于0.008(k=2)。该标准物质具有量值稳定、光谱平坦等特点,可用于各类傅里叶变换红外光谱设备的透射比校准。
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| 关 键 词： | 透射比 单晶硅 中红外光谱 标准物质 |
Preparation of mid-infrared transmittance standard reference materials |
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| FENG Guojin,MA Yuxuan,LIANG Fengchen,GAN Haiyong,ZHENG Chundi,WU Houping,ZHANG Qiaoxiang,LIU Zilong.Preparation of mid-infrared transmittance standard reference materials[J].Chemical Analysis And Meterage,2020,29(1):1-3. |
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| Authors: | FENG Guojin MA Yuxuan LIANG Fengchen GAN Haiyong ZHENG Chundi WU Houping ZHANG Qiaoxiang LIU Zilong |
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| Institution: | (National Institute of Metrology,Beijing 100013,China) |
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| Abstract: | Based on single crystal silicon substrate with stable physical and chemical properties,a series of transmittances in mid-infrared wave range of 500–4000 cm^–1 were achieved by coated with different thicknesses of Ni and Cr mixed film layers.The nominal values of the developed reference materials were 10%and 50%,respectively,and the expand uncertainty was better than 0.008(k=2).The reference material has the characteristics of stable value and flat spectrum,which can be used for the transmittance calibration of various Fourier transform infrared spectroscopy equipment. |
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| Keywords: | transmittance of material single crystal silicon mid-infrared spectroscopy reference material |
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