The application of dielectric analysis to drying latex films |
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Authors: | S. Cleeve D. Elliott T. Strivens |
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Affiliation: | (1) ICI Paints, Wexham Road, SL2 5DS Slough, Berks, England |
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Abstract: | Measurements of real and imaginary capacitance (C andC) have been made during the drying of a film-forming latex. In one experiment dielectric measurements at frequencies between 1 Hz and 100 kHz were made simultaneously with gravimetric measurements on a microbalance. It was found that both the rate of water evaporation and the a.c. conductance decrease sharply at high polymer volume fraction. These results are discussed qualitatively in terms of a model for the film-forming process. In another experimentC andC were recorded at 10 Hz along with automatic measurements of the build-up of the scratch resistance of the film. It was found that the mechanical response to film-formation appears significantly earlier than the dielectric response. This is also discussed qualitatively in terms of the model.The authors would like to thank Dr. I. Abrahams, Dr. S. Bell, and Dr. M. Reading for useful discussions regarding this work and M. Bahra for his help with the TFA measurements. |
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Keywords: | dielectric analysis latex films walescence |
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