Polarisation interferometry flying height testing |
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| Authors: | Xinqun Liu Warwick Clegg Bo Liu |
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| Affiliation: | a Roke Manor Research Limited, Romsey, Hampshire SO51 0ZN, UK;b Victoria University of Wellington, P.O. Box 600, Wellington, New Zealand;c Data Storage Institute, National University of Singapore, Singapore 119260, Singapore |
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| Abstract: | The in-depth analyses of polarisation interferometry flying height testing are presented. The drawbacks of the oblique incidence polarisation interferometry method are discussed. The application of the dual-beam normal incidence polarisation interferometry method is illustrated. It is shown that with this normal incidence polarisation interferometer, not only the flying height can be measured down to contact without losing accuracy, but the optical parameters of the head-slider can also be determined. |
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| Keywords: | Polarisation interferometry Flying height Refractive index determination |
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