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Measurement of inner surface roughness of capillary by an x-ray reflectivity method |
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| Authors: | Li Yu-De Lin Xiao-Yan Tan Zhi-Yuan Sun Tian-Xi and Liu Zhi-Guo |
| Institution: | The Key Laboratory of Beam Technology and Material Modification of Ministry of Education, College of Nuclear Science and Technology, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China |
| Abstract: | The inner surface roughness of a capillary is investigated by the reflectivity of x-rays penetrating through the capillary. The results are consistent with the data from atomic force microscope (AFM). The roughness measured by this new method can reach the order of angstroms with high quality capillaries. |
| Keywords: | inner surface roughness reflectivity method capillary |
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