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占空比对微球a-C:H薄膜制备的影响
引用本文:张宝玲,何智兵,吴卫东,刘兴华,杨向东.占空比对微球a-C:H薄膜制备的影响[J].物理学报,2009,58(9):6436-6440.
作者姓名:张宝玲  何智兵  吴卫东  刘兴华  杨向东
作者单位:(1)四川大学物理科学与技术学院,成都 610065;中国工程物理研究院激光聚变研究中心,绵阳 621900; (2)中国工程物理研究院激光聚变研究中心,绵阳 621900
基金项目:国家高技术研究发展计划惯性约束聚变领域资助的课题.
摘    要:采用低压等离子体化学气相沉积方法(LPPCVD),以反式二丁烯(T2B)和氢气(H2)为工作气体,利用间歇跳动模式在微球表面制备30 μm厚a-C:H涂层.利用原子力显微镜(AFM)和X射线照相技术对涂层表面形貌及壁厚均匀性进行表征,结果表明:随占空比减小,制备出的微球a-C:H薄膜表面粗糙度呈下降趋势,而壁厚均匀性随占空比的减小变化不明显;当占空比为1/5时,在直径为(280±50) μm 的聚乙烯醇-聚苯乙烯(PVA-PS)双层球表面制备出30 μm厚的a-C:H涂层,表面均方根粗糙度(RMS)低于30 nm;占空比为1/7时,不能维持微球的稳定跳动. 关键词: 微球 a-C:H薄膜 粗糙度 壁厚均匀性

关 键 词:微球  a-C:H薄膜  粗糙度  壁厚均匀性
收稿时间:9/4/2008 12:00:00 AM

Influence of duty ratio on the fabrication of a-C:H film on microshell
Zhang Bao-Ling,He Zhi-Bing,Wu Wei-Dong,Liu Xing-Hua,Yang Xiang-Dong.Influence of duty ratio on the fabrication of a-C:H film on microshell[J].Acta Physica Sinica,2009,58(9):6436-6440.
Authors:Zhang Bao-Ling  He Zhi-Bing  Wu Wei-Dong  Liu Xing-Hua  Yang Xiang-Dong
Abstract:Using low-pressure plasma chemical vapor deposition (LPPCVD), with trans-2-butene and hydrogen as the precursors, we have successfully deposited 30 μm CH coatings on microshells in intermittent bounce mode .The surface finish was measured by atomic force microscopy (AFM), It was found that the surface finish was improved greatly with reduced duty ratio. When the duty ratio was 1/5, the surface roughness was less than 30 nm for the 30 μm thick a-C:H film. Uniformity of a-C: H films were measured by X-rayradiography. The results showed that the influence was little of duty ratio to the uniformity of a-C: H film. When the duty ratio was 1/7, microshells could not keep on bouncing.
Keywords:a-C
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