Dielectric properties and Fourier transform IR analysis of MCM-48, Al-MCM-48 and Ti-MCM-48 mesoporous materials |
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| Authors: | G Øye E Axelrod Y Feldman J Sjöblom M Stöcker |
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| Institution: | (1) Department of Chemistry University of Bergen Allégaten 41 5007 Bergen, Norway, NO;(2) Department of Applied Physics The Hebrew University of Jerusalem Givat Ram, 91904 Jerusalem, Israel, IL;(3) SINTEF Applied Chemistry P.O. Box 124, Blindern 0314 Oslo, Norway, NO |
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| Abstract: | Broad-band dielectric spectroscopy was used to investigate the dielectric properties of the meso- porous materials MCM-48,
Al-MCM-48 and Ti-MCM-48. The samples were examined in the frequency range from 20 Hz to 1 MHz and in the temperature range
from −100 to 250 °C. The dielectric relaxation of the materials has a complex nonexponential behavior with some common features
for all the samples. The dielectric spectroscopy and Fourier transform IR measurements identified the relaxation process related
to percolation of H+ ions associated with silanol groups and water adsorbed in the materials. The non-Debye behavior of the macroscopic dipole
correlation functions related to the percolation process allowed us to extract the fractal dimensions of the paths of excitation
transfer within the porous medium, and the porosity of each sample was estimated.
Received: 7 September 1999 Accepted: 10 December 1999 |
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| Keywords: | Dielectric spectroscopy FT-IR spectroscopy Mesoporous materials MCM-48 Al-MCM-48 Ti-MCM-48 |
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