X射线荧光光谱法同时测定电子电气产品中限制使用物质铅、汞、铬、镉和溴

提出了用X射线荧光光谱法同时测定电子电气设备中限制使用物质铅、汞、铬、镉和溴的一种新的测试方法。研究了金属材料基体、聚合物基体和不同电子产品等基体对待测元素的影响，研究了元素间谱线重叠所产生的光谱干扰，考察了样品大小不同和样品厚度不同对待测元素测试结果的影响，并选用Rh线的康普顿散射线作内标来校正这些非光谱干扰的影响。选用自制的参考物质制作工作曲线，各待测元素的浓度范围从最低测定下限100到1 500 mg·kg-1,均获得非常好的线性关系。选用有证标准物质BCR-681，并设置100 s测量时间来计算铅、汞、铬、镉和溴的最低检出限，其检出限分别为Pb L_β 0.64 mg·kg-1,Hg L_α 0.51 mg·kg-1,Cr K_α 0.78 mg·kg-1,Cd K_α 1.10 mg·kg-1和Br K_α 0.27 mg·kg-1。以BCR-681作为实际样品进行测试，其结果与标准推荐值非常吻合。

Simultaneous Determination of Cr, Cd, Br, Pb, and Hg of Regulated Substances in Electrotechnical Products by XRF Spectrometry

The objective of the present research was to develop a nondestructive technique for the analysis of heavy elements of regulated substances in electrotechnical products using an XRF spectrometer. Reference samples were prepared within-house reference materials containing the elements Cr, Cd, Br, Pb, and Hg, and calibration curves of all elements exhibited a good linearity from 100 to 1 500 mg x kg(-1). Thus, the calibration curve method was effective in the determination of heavy elements in electrotechnical products. The minimum detection limits (MDLs) calculated with reference material (BCR-681) ranged from 0. 27 (Br) to 1. 10 mg x kg(-1) (Cd). The interference from background and spectra overlap was discussed. The matrix effect was corrected by experience coefficients, using scattered radiation as an internal standard. The accuracy of the method was evaluated by the analysis of certified reference material of BCR-681. The results are in agreement with certified values with a precision of less than 5. 0%.