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基于DS P的PTCR多功能参数测试仪
引用本文:黎步银,吴红艳,韩颖姝,汪洪.基于DS P的PTCR多功能参数测试仪[J].压电与声光,2005,27(6):688-690.
作者姓名:黎步银  吴红艳  韩颖姝  汪洪
作者单位:华中科技大学,电子科学与技术系,湖北,武汉,430074
基金项目:国家“八六三”计划基金资助项目(2001AA325040)
摘    要:利用数字信号处理器控制外围接口电路,对多路热敏电阻测试电路执行依次通/断电操作,循环执行,以测试其老化性能,循环次数由用户设定。在每次测试第一次通电过程中,控制动作时间比较电路启动,同时数字信号处理芯片自动记录每一路的热敏电阻的动作时间数据,并进行处理。该系统可以同时测试30只热敏元件。

关 键 词:热敏电阻  数字信号处理器  动作时间  老化
文章编号:1004-2474(2005)06-0688-03
收稿时间:2004-02-12
修稿时间:2004年2月12日

Pressure-aging and Operating-time Comprehensive Instrument Based on DSP
LI Bu-yin,WU Hong-yan,HAN Ying-shu,WANG Hong.Pressure-aging and Operating-time Comprehensive Instrument Based on DSP[J].Piezoelectrics & Acoustooptics,2005,27(6):688-690.
Authors:LI Bu-yin  WU Hong-yan  HAN Ying-shu  WANG Hong
Institution:Dept. of Electronic Science and Technology, Huazhong University of Science and Technology, Wuhan 430074, China
Abstract:Using digital signal processor control peripheral equipment first,and then drive every positive temperature coefficient resistance testing circuit switch on and switch off in succession,After all the circuits finished a on/off action,the system circulated these operations untill the cycle times reach the initialization.In the first course of testing,the operating time of compare circuit is brought into play,synchronously,digital signal processor clock all the testing circuits' operating time and keep these data in corresponding locations.This system can tes 30 pieces of positive temperature coefficient resistance at a time.
Keywords:PTC resistance  digital signal processor  operating time  aging
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