|
|||||
|
|
Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork |
|
| Institution: | 1. Service de Physique de l''Etat Condensé, DSM/IRAMIS/SPEC, CNRS UMR 3680, CEA Saclay, 91191 Gif sur Yvette Cedex, France;2. Grupo de Materiales Nanoestructurados, Facultad de Ciencias, Universidad Nacional de Ingeniería, Av. Túpac Amaru 210, Lima 25, Peru;3. CNRS-Laboratoire de Photonique et de Nanostructures, Route de Nozay, 91460 Marcoussis, France |
| Abstract: | |
| Keywords: | Tip etching AFM STM Fowler–Nordheim plot Epitaxial graphene |
| 本文献已被 ScienceDirect 等数据库收录！ | |