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Fluctuating in the hopping rate of CuO thin films with respect to substrate temperature
Authors:N Serin  A Yildiz  E Çam  ? Uzun  T Serin
Institution:1. Department of Engineering Physics, Faculty of Engineering, Ankara University, 06100 Ankara, Turkey;2. Department of Energy Systems Engineering, Faculty of Engineering and Natural Sciences, Y?ld?r?m Beyaz?t University, Ankara, Turkey
Abstract:Electrical transport properties in CuO thin films processed using d.c. magnetron sputtering technique is investigated to understand the correlation between the processing conditions and electrical properties. It is identified that the temperature dependent conductivity of the investigated films is controlled by the multi-phonon hopping conduction mechanism. A detailed analysis in terms of carrier hopping parameters is used to correlate electrical transport properties with the d.c. magnetron sputtering conditions.
Keywords:d  c  Magnetron sputtering technique  CuO  Electrical conductivity  Multi-phonon hopping conduction
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