On the paramagnetic behavior of heavily doped Zn1−xMnxO films fabricated by Pechini’s method |
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Authors: | C. Sá nchez,C. Paucar,A. Mosquera,J.E. Rodrí guez,A. Gó mez,O. Morá n |
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Affiliation: | 1. Laboratorio de Materiales Cerámicos y Vítreos, Universidad Nacional de Colombia, Campus Medellín, A.A. 568, Medellín, Colombia;2. Grupo CYTEMAC, Universidad del Cauca, Calle 5 No. 4-70, Popayán, Colombia;3. Departamento de Ingeniería de Materiales, Universidad Nacional de Colombia, Campus Medellín, A.A. 568, Medellín, Colombia |
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Abstract: | Heavily doped Zn1−xMnxO (x = 0.3) films were prepared by polymeric precursor method onto glass substrates and their structural, morphological, optical and magnetic properties carefully studied. Undoped ZnO films were also prepared for the purpose of comparison. The polymeric precursor method consists in preparing a coating solution from the Pechini process followed by a three-step thermal treatment of the as deposited films at temperatures up to 550 °C for 30 min. X-ray diffraction (XRD) analysis reveals the typical hexagonal wurtzite structure of the undoped ZnO film. The addition of Mn ions leads to a dramatic reduction of the crystalline quality of film although no evidence of affectation by secondary phases is found. The affectation of the ZnO structure may be due to the formation of Mn clusters and generation of defects such as vacancies and interstitials. Here, the solubility limit of the Mn ions in ZnO should play an important role and it is discussed in the framework of ionic radius and valence states. The scanning electron microscopy (SEM) analysis shows that the surface of the doped sample was affected by the presence of cracks due, probably, to the expansion of the lattice constant of Zn0.7Mn0.3O caused by the Mn incorporation in the ZnO lattice. The existence of cluster-type structures on the surface is corroborated by atomic force microscopy (AFM). The EDX analysis, carried out on some areas in the film, yielded Mn/Zn ratios of about 0.3, which points out to an effective Mn incorporation in the film. On the other hand, the absorption edge of the doped films is red shifted to 2.9 eV (3.24 eV for undoped ZnO film) and the absorption edge is less sharp due, probably, to amorphous states appearing in the band gap. No evidence of dilute magnetic semiconductor mean-field ferromagnetic behavior is observed. The temperature dependence of the magnetization follows a Curie law suggesting pure paramagnetic behavior. The very small s-shape behavior of M versus H (without hysteresis) observed at room temperature on selected areas would stem from Mn clusters which are easily formed in transition metal doped ZnO. |
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Keywords: | Zinc oxide Pechini&rsquo s method Dip-coating Dilute magnetic semiconductors |
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