Summary of ISO/TC 201 standard: XIII,ISO 18114:2003—surface chemical analysis—secondary ion mass spectrometry—determination of relative sensitivity factors from ion‐implanted reference materials

This International Standard specifies a method of determining relative sensitivity factors (RSFs) for secondary ion mass spectrometry (SIMS) from ion‐implanted reference materials. The method is applicable to specimens in which the matrix is of uniform chemical composition, and in which the peak concentration of the implanted species does not exceed one atomic percent. Published in 2006 by John Wiley & Sons, Ltd.