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Atomic force microscopy, a tool for characterization, synthesis and chemical processes |
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| Authors: | Genaro Zavala |
| Affiliation: | (1) Department of Physics, Tecnologico de Monterrey, Campus Monterrey, Avenida Eugenio Garza Sada 2501 Sur, Monterrey, Nuevo Leon, 64849, Mexico |
| Abstract: | |
| Keywords: | Atomic force microscopy Scanning force microscopy Scanning probe microscopy Contact mode Non-contact mode Tapping mode Physical properties Electrical properties Mechanical properties Magnetic properties Chemical force microscopy Force Spectroscopy Piezoelectricity Electrostriction Magnetostriction |
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