| 用表面磁光克尔原理测量薄膜材料的磁性参数 |
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| 引用本文： | 祁建霞.用表面磁光克尔原理测量薄膜材料的磁性参数[J].大学物理,2009,28(9). |
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| 作者姓名： | 祁建霞 |
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| 作者单位： | 西安邮电学院,应用数学与应用物理系,陕西,西安,710121 |
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| 基金项目： | 西安邮电学院中青年科研基金资助项目 |
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| 摘 要： | 以表面磁光克尔原理为机理,测量薄膜材料的磁性参数,实验上求得了饱和状态下坡莫合金的克尔偏转角,并测出了其磁滞回线.
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| 关 键 词： | 表面磁光克尔效应 磁滞回线 克尔旋转角 |
Measurement of film's magnetic parameters based on the principle of surface magneto-optic Kerr effect |
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| QI Jian-xia.Measurement of film's magnetic parameters based on the principle of surface magneto-optic Kerr effect[J].College Physics,2009,28(9). |
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| Authors: | QI Jian-xia |
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| Abstract: | Based on the principle of surface magneto-optic Kerr effect, the magnetic parameters of film magnetic material can be measured. The Kerr angle of NiFe material is measured experimentally and the magnetic hysteresis loop is plotted. |
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| Keywords: | surface magneto-optic Kerr effect magnetic hysteresis loop Kerr angle |
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