The electrical and dielectrical behavior of n-conducting perylene tetracarboxylic diimide derivatives |
| |
Authors: | Daniel Lehmann and Dietrich R T Zahn |
| |
Institution: | (1) Chemnitz University of Technology, Semiconductor Physics, 09107 Chemnitz, Germany |
| |
Abstract: | A comparison of the electrical characteristics of organic field-effect transistors (OFETs) based on derivatives of the electron-conductor
perylene tetracarboxylic diimide (PTCDI) in top-contact configuration is presented. The derivatives used are N,N′-dimethyl-3,4,9,10-perylene-tetracarboxylic-diimide
(DiMe-PTCDI), N,N′-diphenyl-3,4,9,10-perylene-tetracarboxylic-diimide (DiPhenyl-PTCDI), N,N′-dimethoxyethyl-3,4,9,10-perylene-tetracarboxylic-diimide
(DiMethoxyethyl-PTCDI), N,N′-di(3-pentyl)-3,4,9,10-perylene-tetracarboxylic-diimide (Di3Pentyl-PTCDI), and N,N′-diheptyl-3,4,9,10-perylene-tetracarboxylic-diimide
(DiHeptyl-PTCDI). Current/voltage measurements were first performed in situ and later ex situ. Additionally, the effect of
annealing and bias stress was probed in situ. A strong influence of the different side groups on the order of magnitude of
the electron mobility is revealed, ranging from 4×10−6 cm2/V s for DiMethoxyethyl-PTCDI to 5×10−2 cm2/V s for DiHeptyl-PTCDI. While none of the devices was stable in air after exposition to air, only the DiMe-PTCDI one resumed
its functionality after restoring vacuum conditions. The dielectric functions of the derivatives was derived, additionally
revealing optical isotropy for all films and varying surface roughness. While DiHeptyl-PTCDI and Di3Pentyl-PTCDI, yielding
also the highest electron mobilities, form smooth layers with negligible surface roughness, strong island formation was be
observed for DiPhenyl-PTCDI and DiMethoxyethyl-PTCDI, yielding low mobilities. This island growth was also confirmed by atomic
force microscopy measurements. Ageing of the samples for several months under ambient conditions leads to increased roughness
for the very rough samples. Layers with smooth surface, on the other hand, showed no significant change in the dielectric
behavior of the sample. |
| |
Keywords: | PACS" target="_blank">PACS 72 80 Le 85 30 Tv 78 20 Ci |
本文献已被 SpringerLink 等数据库收录! |
|