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The First Crystal Structures of Industrial Laked Yellow Pigments Determined by X‐ray Powder Diffraction
Authors:Martin U. Schmidt Prof. Dr.  Jacco van de Streek Dr.  Svetlana N. Ivashevskaya Dr.
Affiliation:1. Institut für Anorganische und Analytische Chemie, Goethe‐Universit?t, Max‐von‐Laue‐Str. 7, 60438 Frankfurt am Main (Germany), Fax: (+49)?69?798?29235;2. Present address: Avant‐garde Materials Simulation, Merzhauserstr. 177, 79100 Freiburg (Germany);3. Institute of Geology, Karelian Research Centre, Russian Academy of Sciences, Pushkinskaya, 11, 185910 Petrozavodsk (Russia)
Abstract:
Keywords:dyes/pigments  Rietveld refinement  structure elucidation  X‐ray diffraction  X‐ray powder diffraction
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