Modeling monofractal microscopy images

Methods for modeling monofractal microscopy images on the basis of space-frequency filtration are proposed. The spectral density and structural function of the monofractal images are assumed to be constant. Space-frequency filtration of the initial image is used for modeling; it transforms the amplitude distribution so that the integral frequency characteristic of the Fourier spectrum of individual segments is modified into a function that diminishes in accordance with a power law. The degree to which it diminishes for each segment is selected to ensure that estimates of the structural functions of the first and higher orders in a double logarithmic scale are approximated well by linear dependencies. The possibilities of our methods are demonstrated by modeling monofractal images of nanostructures for samples of amorphous alloys obtained via electrolytic deposition.